Application Engineer V - (E5)

Develop and support on-wafer metrology applications for semiconductor process tool qualification, with expertise in optical thin film metrology (Ellipsometry, Scatterometry, Reflectometry) and/or X-ray based metrology. Collaborate with process teams to build metrology solutions, implement best practices, and analyze data to enable product and process development. Lead complex technical activities, partner with vendors on emerging techniques, and support global Applied teams with limited (<10%) travel.