F16 Metrology Application Engineer

Micron Technology
Taiwan
Workplace: OnsiteFull timeFunction: Industrial, Process & Manufacturing EngineeringSkills: []

Develop, analyze, and implement metrology measurement techniques for films, with a focus on lithography overlay and CD-SEM, while also covering characterization methods such as ellipsometry/scatterometry, XRF, and surface profiling. Drive supplier tool CIP and support NPI transfer by defining quality metrics and improving metrology performance. Engage in fab operations to improve quality, cost, cycle time, and yield through standardized knowledge and next-generation measurement capability planning.

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Micron Technology
Micron Technology
3 weeks ago

F16 Metrology Application Engineer

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Last checked: 6 hours agoStatus: Live

Job Summary

Develop, analyze, and implement metrology measurement techniques for films, with a focus on lithography overlay and CD-SEM, while also covering characterization methods such as ellipsometry/scatterometry, XRF, and surface profiling. Drive supplier tool CIP and support NPI transfer by defining quality metrics and improving metrology performance. Engage in fab operations to improve quality, cost, cycle time, and yield through standardized knowledge and next-generation measurement capability planning.
Location: Taiwan
Workplace: Onsite
Employment Type: Full time
Job Function: Industrial, Process & Manufacturing Engineering

Key Responsibilities

  • •Develop, analyze, and implement metrology measurement techniques for films, focusing on lithography overlay and CD-SEM, and covering ellipsometry/scatterometry, modeling, XRF, and surface profiling.
  • •Perform SWR lots to help engineers complete evaluations for set-up metrology of newly introduced processes and new process equipment.
  • •Drive supplier tool CIP activity and support NPI transfer by defining quality metrics, achieving metrology performance, and providing weekly progress summaries.
  • •Actively support fab operations by improving quality, reducing cost and cycle time, and increasing yield through metrology work.
  • •Deliver reliable metrology applications, standardize BKM/ways of working for the metrology team, and early engage with TD and MCT for cutting-edge technology introduction.

Key Requirements

  • •Develop and implement metrology measurement techniques for films, including lithography overlay and CD-SEM.
  • •Cover characterization areas such as ellipsometry/scatterometry, modeling, XRF, and surface profiling.
  • •Perform SWR (Special Work Request) lots to support evaluations for set-up metrology of newly introduced processes and equipment.
  • •Drive supplier tool CIP activity and participate in NPI (New Product Introduction) transfer work by defining quality metrics and achieving metrology performance.
  • •Engage with fab operations to improve quality, reduce cost, reduce cycle time, and improve yield through metrology application work.
Tech Stack:Lithography overlayCD-SEMEllipsometryScatterometryModelingXRFSurface profilingSWR lotsNPI transfer

Company Brief

Micron Technology
Designs and manufactures semiconductor memory and storage solutions, including DRAM, NAND, and NOR flash, for computing, networking, mobile, and automotive markets worldwide.
Industry: Electronics Manufacturing
Company Size: Enterprise (1,001+ employees)
Revenue: USD 1B+
Growth: Public Company
Valuation: Public Company (Market Cap in USD)
Funding: IPO / Publicly Listed
Headquarters: Boise, United States
Founded: 1978
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