Digital Failure Analysis Engineer (LFAB)

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Source: Company careers pageValidated by: Fursa AI

Last checked: 21 hours agoStatus: Live

Job Summary

Join LFAB to investigate complex digital failures and drive root-cause discovery across yield, quality, and product development. You’ll analyze failing silicon using DFT-enabled observability, scan diagnostics, ATPG test vectors, and targeted physical methods like emission microscopy. Partner with design, test, physical FA specialists, and product/fab process engineers to improve yield, optimize DFT coverage, and support production silicon debug.

Location: United States

Workplace: Onsite

Employment Type: Full time

Job Function: Data Science & Machine Learning

Seniority: Mid level

Key Responsibilities

•Perform digital failure analysis and root cause analysis by integrating test/characterization data, DFT-enabled observability, scan diagnosis, and targeted physical analysis.
•Use ATPG-generated test vectors and scan diagnostics to isolate failure mechanisms and connect findings to corrective actions across yield and quality.
•Conduct deep-dive VLSI and silicon debug to correlate electrical characterization with design netlist and layout.
•Collaborate cross-functionally with design, test, physical FA, and product/fab process teams to improve yield and optimize DFT coverage and diagnostics.
•Support product engineering work (10-20%) by analyzing production yield issues, identifying root causes, and helping characterize/qualify and release new products.

Key Requirements

•Bachelor’s degree in Computer Engineering, Electrical Engineering, Physics, or a related degree.
•3+ years of experience in the semiconductor industry.
•Experience with DFT and ATPG for SoC or ASIC designs.
•Experience using industry-standard DFT/ATPG EDA tools.
•Strong digital design fundamentals and analytical problem-solving skills.

Experience:Semiconductor industry

Education:Bachelor's in Computer Engineering, Electrical Engineering, Physics, or related degree

Skills:Problem-solvingCommunicationAnalytical thinkingTime managementSelf-motivation

Tech Stack:DFTATPGSoCASICVLSIEDA toolsScan diagnosticsEmission microscopyTest vectorsDFT-enabled observabilityEDA

Company Brief

Texas Instruments

Industry: Electronics Manufacturing

Website

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Texas Instruments

2 weeks ago

Digital Failure Analysis Engineer (LFAB)

✓ Verified Job

Canonical indexed version, validated from employer's careers page.

Source: Company careers pageValidated by: Fursa AI

Last checked: 21 hours agoStatus: Live

Job Summary

Location: United States

Workplace: Onsite

Employment Type: Full time

Job Function: Data Science & Machine Learning

Seniority: Mid level

Key Responsibilities

•Perform digital failure analysis and root cause analysis by integrating test/characterization data, DFT-enabled observability, scan diagnosis, and targeted physical analysis.
•Use ATPG-generated test vectors and scan diagnostics to isolate failure mechanisms and connect findings to corrective actions across yield and quality.
•Conduct deep-dive VLSI and silicon debug to correlate electrical characterization with design netlist and layout.
•Collaborate cross-functionally with design, test, physical FA, and product/fab process teams to improve yield and optimize DFT coverage and diagnostics.
•Support product engineering work (10-20%) by analyzing production yield issues, identifying root causes, and helping characterize/qualify and release new products.

Key Requirements

•Bachelor’s degree in Computer Engineering, Electrical Engineering, Physics, or a related degree.
•3+ years of experience in the semiconductor industry.
•Experience with DFT and ATPG for SoC or ASIC designs.
•Experience using industry-standard DFT/ATPG EDA tools.
•Strong digital design fundamentals and analytical problem-solving skills.

Experience:Semiconductor industry

Education:Bachelor's in Computer Engineering, Electrical Engineering, Physics, or related degree

Skills:Problem-solvingCommunicationAnalytical thinkingTime managementSelf-motivation

Tech Stack:DFTATPGSoCASICVLSIEDA toolsScan diagnosticsEmission microscopyTest vectorsDFT-enabled observabilityEDA

Company Brief

Texas Instruments

Industry: Electronics Manufacturing

Website