F16N Metrology Application Engineer

Micron Technology
Taiwan
Workplace: OnsiteFull timeFunction: Industrial, Process & Manufacturing EngineeringExperience: 2-4 yearsSkills: ["Automation","Data-driven insights","Continuous improvement","Problem-solving","Decision-making"]

Develop and implement metrology measurement techniques for semiconductor films, with a focus on lithography overlay and CD-SEM, and coverage of ellipsometry/scatterometry characterization, modeling, XRF, and surface profiling. Execute SWR lots to support evaluation of new process setups, drive supplier tool CIP and NPI transfer activities, define quality metrics, and improve metrology performance. Work in the fab to improve quality, cost, cycle time, and yield while standardizing knowledge and leveraging AI-enabled ways of working.

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FursaFursa
Micron Technology
Micron Technology
2 weeks ago

F16N Metrology Application Engineer

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Job Summary

Develop and implement metrology measurement techniques for semiconductor films, with a focus on lithography overlay and CD-SEM, and coverage of ellipsometry/scatterometry characterization, modeling, XRF, and surface profiling. Execute SWR lots to support evaluation of new process setups, drive supplier tool CIP and NPI transfer activities, define quality metrics, and improve metrology performance. Work in the fab to improve quality, cost, cycle time, and yield while standardizing knowledge and leveraging AI-enabled ways of working.
Location: Taiwan
Workplace: Onsite
Employment Type: Full time
Job Function: Industrial, Process & Manufacturing Engineering
Seniority: Mid level

Key Responsibilities

  • •Develop, analyze, and implement metrology measurement techniques for films, focusing on lithography overlay and CD-SEM.
  • •Perform SWR lots to support engineers’ evaluations for metrology setup of new processes and equipment for improvement, optimization, or characterization.
  • •Drive supplier tool CIP activity, support NPI transfer, define quality metrics, achieve metrology performance, and provide weekly summary updates.
  • •Engage in fab operations to improve quality, reduce cost, reduce cycle time, and improve yield; analyze next-generation measurement capabilities.
  • •Deliver reliable metrology applications, standardize BKM/ways of working, and collaborate early with TD and MCT on cutting-edge technology introduction.

Key Requirements

  • •2–4 years of experience (as indicated by the role’s experience range).
  • •Develop, analyze, and implement metrology measurement techniques for semiconductor films, including lithography overlay and CD-SEM.
  • •Cover additional characterization areas such as ellipsometry/scatterometry modeling and techniques like XRF and surface profiling.
  • •Perform SWR lots to assist engineers with evaluations for new process setup metrology and process improvement/optimization.
  • •Drive supplier tool CIP and contribute to NPI transfer activities while defining quality metrics and achieving metrology performance.
Experience:2-4 yearsSemiconductor manufacturing
Skills:AutomationData-driven insightsContinuous improvementProblem-solvingDecision-making
Tech Stack:AIAutomationLithography overlayCD-SEMEllipsometryScatterometryXRFSurface profiling

Company Brief

Micron Technology
Designs and manufactures semiconductor memory and storage solutions, including DRAM, NAND, and NOR flash, for computing, networking, mobile, and automotive markets worldwide.
Industry: Electronics Manufacturing
Company Size: Enterprise (1,001+ employees)
Revenue: USD 1B+
Growth: Public Company
Valuation: Public Company (Market Cap in USD)
Funding: IPO / Publicly Listed
Headquarters: Boise, United States
Founded: 1978
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